Welcome!
Marum Consulting specializes in high current curve tracers to characterize device behavior under electrical overstress (EOS) and Electrostatic Discharge (ESD) conditions. These curves show how devices behave under Human Body Model (HBM) and IEC 61000-4-2 system level ESD stress as well as IEC 61000-4-5 surge stress conditions. These instruments complement, and in many cases can replace, a much more expensive Transmission Line Pulser (TLP) test system.+
Equipment costs are held down by utilizing your computer as the test interface with the necessary included LabVIEW software, which also enables more efficient and effective processing of the data.
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| Test hardware is USB linked to allow using your computer’s display with included LabVIEW control program. |
Introducing Two New High Current Characterization Testing Devices
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A Low Cost Tool for Characterizing ESD Clamps, Transient Voltage Protectors, and Application Circuits at currents up to 20 amperes |
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A Low Cost Tool for Characterizing ESD Clamps, Transient Voltage Protectors, and Application Circuits when subjected to the IEC 61000-4-5 surge stress at currents up to 25 amperes |


